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are in progress. Sm2+ shows emission in the near‐infrared range, and has attracted much attention for use in Si‐PD type photodetectors. Figure 1.5 shows typical scintillation spectra of such scintillators with various emission wavelengths superposed with typical quantum efficiency curves of common photodetectors. It should be noted that the emission wavelength by 5d‐4f transitions strongly depends on the crystal field, which is specific to each host lattice; the presented data are only examples.

Schematic illustration of emission spectra of scintillators under X-ray irradiation and typical quantum efficiencies of Si-PD and PMT.

      1.3.3 Scintillation Light Yield and Energy Resolution

      Here, we will introduce the common explanation on the scintillation light yield. The semi‐empirical approach was made in 1980 by Robbins [56] based on semiconductor physics. In the semiconductor radiation detector, empirical relation of ξ (average energy consumed per electron–hole pair) and Eg (band‐gap energy) are connected by a parameter β as

      (1.2)equation

      In this approach, to consider ξ, the energy of electron–hole pairs, falls below the threshold energy for impact ionization:

      where Ei, Eop, and Ef represent the threshold energy for impact ionization, energy emitted as optical phonons, and average residual energy of electron–hole pairs, respectively. Throughout this discussion, the unit of ξ (energy) is eV. Here, we consider the branching ratio of optical phonon emission with the probability of r and the impact ionization with (1‐r) under the initial absorbed energy of E0. If the energy after some processes, such as impact ionization and phonon emission, remains at >Ei, the impact ionization (excitation process) continues. In the ideal case, the limiting efficiency (Y) of the production of electron–hole pairs is

      and by using this relation, the average energy per electron–hole pair is re‐written as

      where Lf = Ef/Ei and K means the ratio of rate of optical phonons rate of energy loss by ionization, expressed as

      (1.6)equation

      In this equation, ℏωLO means the energy of the longitudinal optical phonon. If we assume this energy and the optical phonon energy is constant, K can be expressed as

      (1.7)equation

      Here, we assume special conditions of: (i) Ionization rate is constant for carrier energy; and (ii) Ei = 1.5Eg, and according to the avalanche multiplication data of Si, then K can be approximated to

      In order to proceed with the calculation, we assume a polaron model where a polaron accompanies α/2 phonons, then α can be expressed as

      (1.9)equation

      where K and K0 are static and high‐frequency dielectric constants, respectively. Under this condition, the optical phonon generation rate is proportional to

      (1.10)equation

      Thus, K can be expressed as

      (1.11)equation

      By using these equations, we can estimate the scintillation emission efficiency semi‐empirically. Following this first approach, the model was modified for actual use in daily experiments. In 1994 [57], the scintillation light output L per unit energy was expressed as

      (1.12)equation

      where ne‐h is the number of electron–hole pairs under γ‐ray with energy of Eγ irradiation, nmax is the number of electron hole pairs which would be generated if there were no losses to optical phonons, S stands for transfer efficiency from the host to luminescence centers, Q is luminescence quantum efficiency at localized luminescence centers, and η is total scintillation efficiency.

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