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X-Ray Fluorescence Spectroscopy for Laboratory Applications. Jörg Flock
Читать онлайн.Название X-Ray Fluorescence Spectroscopy for Laboratory Applications
Год выпуска 0
isbn 9783527816620
Автор произведения Jörg Flock
Жанр Химия
Издательство John Wiley & Sons Limited
17 11 Analysis of Liquids 11.1 Multielement Analysis of Liquids 11.2 Fuels and Oils 11.3 Trace Analysis in Liquids 11.4 Special Preparation Techniques for Liquid Samples
18 12 Trace Analysis Using Total Reflection X-Ray Fluorescence 12.1 Special Features of TXRF 12.2 Sample Preparation for TXRF 12.3 Evaluation of the Spectra 12.4 Typical Applications of the TXRF
19 13 Nonhomogeneous Samples 13.1 Measurement Modes 13.2 Instrument Requirements 13.3 Data Evaluation
20 14 Coating Analysis 14.1 Analytical Task 14.2 Sample Handling 14.3 Measurement Technology 14.4 The Analysis Examples of Coated Samples
21 15 Spot Analyses 15.1 Particle Analyses 15.2 Identification of Inclusions 15.3 Material Identification with Handheld Instruments 15.4 Determination of Toxic Elements in Consumer Products: RoHS Monitoring 15.5 Toxic Elements in Toys: Toys Standard
22 16 Analysis of Element Distributions 16.1 General Remarks 16.2 Measurement Conditions 16.3 Geology 16.4 Electronics 16.5 Archeometric Investigations 16.6 Homogeneity Tests
23 17 Special Applications of the XRF 17.1 High-Throughput Screening and Combinatorial Analysis 17.2 Chemometric Spectral Evaluation 17.3 High-Resolution Spectroscopy for Speciation Analysis
24 18 Process Control and Automation 18.1 General Objectives 18.2 Off-Line and At-Line Analysis 18.3 In-Line and On-Line Analysis
25 19 Quality Management and Validation 19.1 Motivation 19.2 Validation
27 Appendix B: Important Information B.1 Coordinates of Main Manufacturers of Instruments and Preparation Tools B.2 Main Suppliers of Standard Materials B.3 Important Websites B.4 Laws and Acts, Which Are Important for X-Ray Fluorescence
28 References
29 Index
List of Tables
1 Chapter 2Table 2.1 Approximate relative line intensities of main X-ray lines.Table 2.2 Comparison of line designations for the main X-ray lines.
2 Chapter 3Table 3.1 Preparation technologies for solid samples.Table 3.2 Information depth for different fluorescence lines in various mater...Table 3.3 Information depth and accumulated intensity in the case of 10 wt% N...Table 3.4 Estimations of the sample volume and mass that contribute to the me...Table 3.5 Contaminations in the range of traces by preparation tools (main co...Table 3.6 Steps for processing and sampling of small part materials.Table 3.7 Mills for fine grinding of powder-like material.Table 3.8 Binders and additives for pressed pellets.Table 3.9 Flux agents for different applications.Table 3.10 Sample–flux ratios for typical materials in grams (valid for diame...Table 3.11 Window materials for sample cups for liquid samples.
3 Chapter 4Table 4.1 Comparison of wavelength- and energy-dispersive X-ray spectrometer ...Table 4.2 Often used crystals for wavelength-dispersive spectrometry.Table 4.3 Instrument setup parameters.Table 4.4 Products offered by instrument manufacturers for different instrume...
4 Chapter 5Table 5.1 Contributions to the Cr intensity by primary, secondary, and tertia...Table 5.2 Relative statistical error as a function of the number of counts.Table 5.3 Substances