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beam is made to fall on a sample support containing a thin specimen of the sample at an angle less than the critical angle, corresponding to the monochromatic beam and sample support being used for sample excitation[5,8,10]. The sample is excited efficiently, as mentioned above, and the emitted X‐rays are detected using a Si(Li) or any other solid state detector. The totally reflected beam is stopped by a beam stopper so that it does not pass further and harm any laboratory personnel in the area. A schematic of the TXRF configuration is shown in Figure 4.4 given below.

      4.4.4 Sample Preparation for TXRF Analysis

      The main steps in TXRF analysis of any sample are:

      1 Dissolution of the sample in a suitable medium (mostly acids).

      2 Matrix separation, if required.

      3 Mixing of the remaining sample solution after matrix separation with a suitable internal standard.

      4 Aliquoting a small volume (2–10 μl) of the above solution on the center of a sample support and drying it under an IR lamp to produce a thin film specimen.

      5 Loading of the specimen in the TXRF spectrometer to measure its spectra.

      6 Processing of the TXRF spectra obtained: identification of the peaks, deconvolution of the interfering peaks, determining the intensity of the X‐ray lines, and conversion of the intensities to the concentration.

Schematic illustration of a TXRF instrumentation for trace element analysis. Schematic illustration of flow chart of sample preparation in TXRF analysis.

      (4.3)equation

      Where, C x and CIS are the TXRF‐determined concentration of analyte x and actual concentration of the internal standard (IS) added, respectively. N x and N IS are the area of the analyte (x) X‐ray line peak and area of internal standard X‐ray line peak (in counts) chosen for analysis, respectively. RS x is the relative sensitivity of the analyte X‐ray line with respect to the internal standard X‐ray line. Since the relative sensitivities are the ratio of the elements sensitivity (Sx) and the sensitivity of the internal standard (SIS), the relative sensitivity of the internal standard is one. This equation holds good as long as the instrumental parameters are the same and the matrix effects are negligible. Once the matrix effect becomes appreciable, the intensity of the X‐ray lines coming from the sample varies not only with the sensitivity but also due to the effect of the matrix on the analyte lines. The analysis results shall be erroneous in that case. From the above discussion, it is clear that this methodology of sample analysis is very simple and no matrix matched standards are required [8, 10].

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